Lateral shearing interferometry of high-harmonic wavefronts

Optics Letters

Volumn 36, Issue 10, 2011, Pages 1746-1748

  Austin, Dane R ^a,c   Witting, Tobias ^a,b   Arrell, Christopher A ^b   Frank, Felix ^b   Wyatt, Adam S ^a   Marangos, Jon P ^b   Tisch, John W G ^b   Walmsley, Ian A ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EXTREME ULTRAVIOLET SPECTROMETERS; HARMONIC ORDERS; HIGH HARMONICS; LATERAL SHEARING INTERFEROMETRY; MACROSCOPIC EFFECTS; PHASE DERIVATIVES; SPATIAL PROFILES;

INTERFEROMETRY; SHEARING; ULTRAVIOLET SPECTROMETERS; ULTRAVIOLET SPECTROSCOPY; WAVEFRONTS;

HARMONIC ANALYSIS;

EID: 79956311027     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.001746     Document Type: Article

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