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Optics Letters

Volumn 36, Issue 9, 2011, Pages 1719-1721

Phase retrieval in quantitative x-ray microtomography with a single sample-to-detector distance

(6) Chen, R C a,b Xie, H L a Rigon, L b Longo, R b,c Castelli, E b,c Xiao, T Q a

a SHANGHAI INSTITUTE OF APPLIED PHYSICS (China)

b SEZIONE DI TRIESTE (Italy)

c UNIVERSITY OF TRIESTE (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTED TOMOGRAPHY; CORRECTION FACTORS; DATA POINTS; EXPERIMENTAL DATA; PHASE INFORMATION; PHASE RETRIEVAL; PHASE-ATTENUATION DUALITY; PHASE-CONTRAST; PHASE-CONTRAST IMAGE; PRACTICAL METHOD; PRIOR KNOWLEDGE; RADIATION DOSE; SAMPLE-TO-DETECTOR DISTANCE; X RAY MICROTOMOGRAPHY;

ABSORPTION; COMPUTERIZED TOMOGRAPHY; TOMOGRAPHY;

X RAYS;

EID: 79956305953 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.36.001719 Document Type: Article

Times cited : (54)

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