Point-contact study of ReFeAsO1 - XFx (Re = La, Sm) superconducting films

Superconductor Science and Technology

Volumn 24, Issue 6, 2011, Pages

  Naidyuk, Yu G ^a   Kvitnitskaya, O E ^a   Yanson, I K ^a   Fuchs, G ^b   Haindl, S ^b   Kidszun, M ^b   Schultz, L ^b   Holzapfel, B ^b  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL TEMPERATURES; GAP RATIO; SUPERCONDUCTING GAPS; TEMPERATURE DEPENDENCE;

MICROCOMPUTERS; POINT CONTACTS; SUPERCONDUCTIVITY;

SUPERCONDUCTING FILMS;

EID: 79956203849     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/6/065010     Document Type: Article

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