Achieving 0.2% relative expanded uncertainty in ion chromatography analysis using a high-performance methodology

Analytical Chemistry

Volumn 83, Issue 10, 2011, Pages 3801-3807

  Brennan, Ryan G ^a   Butler, Therese A ^a   Winchester, Michael R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTES; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY; INTERNAL STANDARDS; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; PEAK AREA; PEAK HEIGHT; STANDARD REFERENCE MATERIAL; STANDARD SOLUTIONS; STRONG CORRELATION;

CHROMATOGRAPHY; INDUCTIVELY COUPLED PLASMA; ION CHROMATOGRAPHY; IONS; OPTICAL EMISSION SPECTROSCOPY; STANDARDS;

UNCERTAINTY ANALYSIS;

EID: 79956155305     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac200290y     Document Type: Article

References (11)

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