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Volumn , Issue , 2008, Pages 143-148
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Safe exploration for reinforcement learning
a,b a,c a,d a
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTROLLED SYSTEM;
CRITICAL STATE;
SAFETY CONSTRAINT;
SAFETY DEGREE;
SAFETY FUNCTIONS;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
NEURAL NETWORKS;
REINFORCEMENT LEARNING;
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EID: 79956136559
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (134)
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References (7)
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