Determination of Cd, Cr, Hg and Pb in plastics from waste electrical and electronic equipment by inductively coupled plasma mass spectrometry with collision-reaction interface technology

Journal of Hazardous Materials

Volumn 190, Issue 1-3, 2011, Pages 833-839

  Santos, Mirian C ^a   Nóbrega, Joaquim A ^b   Cadore, Solange ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

Collision reaction interface; Inductively coupled mass spectrometry; Plastics; Toxic elements

Indexed keywords

ANALYTE CONCENTRATION; ANALYTES; COLLISION-REACTION INTERFACE; DETERMINATION OF CHROMIUMS; INDUCTIVELY COUPLED MASS SPECTROMETRY; INDUCTIVELY-COUPLED; INTERFACE TECHNOLOGY; LIMITS OF DETECTION; PLASMA MASS SPECTROMETERS; POLYATOMIC ION; QUADRUPOLES; SIMULTANEOUS DETERMINATIONS; SPECTRAL OVERLAP; TOXIC ELEMENTS; WASTE ELECTRICAL AND ELECTRONIC EQUIPMENT;

AMPLIFIERS (ELECTRONIC); CADMIUM; CHROMIUM; COLLISIONAL PLASMAS; ELASTOMERS; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ISOTOPES; MASS SPECTROMETERS; OSCILLATORS (ELECTRONIC); PLASMA DIAGNOSTICS; PLASTICS; SPECTROMETRY;

LEAD;

CADMIUM; CHROMIUM; LEAD; MERCURY; PLASTIC;

CHROMIUM; COLLISION; CONCENTRATION (COMPOSITION); ELECTRICAL METHOD; ELECTRONIC EQUIPMENT; HEAVY METAL; HELIUM; HYDROGEN; ION; ISOTOPIC ANALYSIS; MASS SPECTROMETRY; MEASUREMENT METHOD; PLASMA; TOXIC SUBSTANCE;

ARTICLE; LIMIT OF DETECTION; MASS SPECTROMETRY; MICROCOMPUTER; MOBILE PHONE;

CADMIUM; CHROMIUM; ELECTRONIC WASTE; ELECTRONICS; LEAD; MASS SPECTROMETRY; MERCURY; METALS, HEAVY; PLASTICS; TECHNOLOGY;

EID: 79956105745     PISSN: 03043894     EISSN: 18733336     Source Type: Journal    
DOI: 10.1016/j.jhazmat.2011.04.004     Document Type: Article

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