Characterization of top-quality type IIa synthetic diamonds for new X-ray optics

Diamond and Related Materials

Volumn 20, Issue 5-6, 2011, Pages 726-728

  Polyakov, S N ^a,b   Denisov, V N ^b,c   N v kuzmin, ^b   Kuznetsov, M S ^b   Martyushov, S Yu ^b   Nosukhin, S A ^b   Terentiev, S A ^b   Blank, V D ^b,c  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b TECHNOLOGICAL INSTITUTE FOR SUPERHARD AND NOVEL CARBON MATERIALS   (Russian Federation)

^c INSTITUTE OF SPECTROSCOPY   (Russian Federation)

Author keywords

High resolution diffractometry; HPHT synthetic diamond; Optical spectroscopy; X ray optical elements; X ray topography

Indexed keywords

HIGH RESOLUTION DIFFRACTOMETRY; HPHT SYNTHETIC DIAMOND; OPTICAL SPECTROSCOPY; X-RAY OPTICAL ELEMENTS; X-RAY TOPOGRAPHY;

DIFFRACTION; FIBER OPTIC SENSORS; FREE ELECTRON LASERS; MAGNETIC FIELD MEASUREMENT; MIRRORS; OPTICS; SINGLE CRYSTALS; X RAYS;

SYNTHETIC DIAMONDS;

EID: 79956103591     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2011.03.012     Document Type: Article

References (5)

1. Yu.V. Shvyd'ko Nature Physics 6 2010 196 199
2. Yu.V. Shvyd'ko, V.D. Blank, S.A. Terentiev et al., Bragg reflectivity of X-ray - at the limit of possible, 2011 (to be published).
3. V.D. Blank Diamond and Related Materials 16 2007 800 804
4. X.R. Huang Journal of Applied Crystallography 43 2010 926 928
5. G.V. Fetisov L.A. Aslanov, Structure research techniques of materials 2007 Physmat Lit Moscow