Charge spectroscopy of SiO2 layers with embedded silicon nanocrystals modified by irradiation with high-energy ions

Semiconductors

Volumn 45, Issue 5, 2011, Pages 582-586

  Antonova, I V ^a   Smagulova, S A ^b   Neustroev, E P ^b   Skuratov, V A ^c   Jedrzejewski, J ^d   Savir, E ^d   Balberg, I ^d  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b North East State University   (Russian Federation)

^c JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79956099867     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782611050034     Document Type: Article

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