Correlation of surface molecular composition to nanoscale elastic behavior and topography of stretched polyurethane films

Applied Physics Letters

Volumn 80, Issue 10, 2002, Pages 1829-1831

  Amitay Sadovsky, E ^a   Komvopoulos, K ^a   Tian, Y ^b   Somorjai, G A ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Polymer Technology Group   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ELASTIC BEHAVIOR; HARD SEGMENTS; MOLECULAR COMPOSITIONS; MOLECULAR REORIENTATION; NANO SCALE; POLYURETHANE FILMS; SUM FREQUENCY GENERATION VIBRATIONAL SPECTROSCOPIES; TIME-DEPENDENT PROCESS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; NANOTECHNOLOGY; POLYURETHANES; TOPOGRAPHY;

SURFACE TOPOGRAPHY;

EID: 79956058614     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1458526     Document Type: Article

References (7)

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