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Volumn 81, Issue 5, 2002, Pages 904-906

On the role of Ge in the growth of β-FeSi2 on silicon (100) surfaces

Author keywords

[No Author keywords available]

Indexed keywords

GE ATOM; HIGH DENSITY; MICROGRAINS; SI SUBSTRATES; SI-GE ALLOYS; SILICIDE LAYERS; SILICON (100); SSBAUER SPECTROSCOPIES;

EID: 79956049015     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1497185     Document Type: Article
Times cited : (3)

References (26)
  • 1
    • 0031528616 scopus 로고    scopus 로고
    • psa PSSABA 0031-8965
    • H. Lange, Phys. Status Solidi A 201, 3 (1997). psa PSSABA 0031-8965
    • (1997) Phys. Status Solidi A , vol.201 , pp. 3
    • Lange, H.1
  • 10
    • 79957946648 scopus 로고    scopus 로고
    • (private communication)
    • V. E. Borisenko (private communication).
    • Borisenko, V.E.1
  • 19
    • 0000068783 scopus 로고
    • edited by I. J. Gruverman and C. W. Seidel (Plenum, New York
    • G. Weyer, in Mössbauer Effect Methodology, edited by I. J. Gruverman and C. W. Seidel (Plenum, New York, 1976), Vol. 10, p. 301.
    • (1976) Mössbauer Effect Methodology , vol.10 , pp. 301
    • Weyer, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.