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Volumn 81, Issue 14, 2002, Pages 2584-2586

Growth and spin-resolved photoemission spectroscopy of the epitaxial α-Al2O3/Fe(110) system

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDES; ELECTRONIC AND STRUCTURAL PROPERTIES; OXIDE LAYER THICKNESS; ROOM TEMPERATURE; SCATTERING CROSS SECTION; ULTRA-THIN;

EPITAXIAL GROWTH; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; ULTRATHIN FILMS;

EPITAXIAL FILMS;

EID: 79956049014 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1507836 Document Type: Article

Times cited : (8)

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