Antiferromagnetic hysteresis in magnetoresistive multilayers investigated by x-ray resonant scattering

Applied Physics Letters

Volumn 81, Issue 18, 2002, Pages 3425-3427

  Spezzani, Carlo ^a   Torelli, Piero ^a   Sacchi, Maurizio ^a   Delaunay, Renaud ^b   Hague, Coryn F ^b   Cros, Vincent ^a,c   Petroff, Frédéric ^a,c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b Université Pierre et Marie Curie   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETICS; CO/CU MULTILAYERS; DIRECT PROBE; IN-SITU; IRREVERSIBLE PROCESS; MAGNETIC ORDERS; MAGNETORESISTIVE MULTILAYERS; RESONANT SCATTERING; SOFT X-RAY; X-RAY RESONANT SCATTERING;

ANTIFERROMAGNETISM; ELECTRIC RESISTANCE; MAGNETIC MULTILAYERS; STATISTICAL MECHANICS;

MULTILAYERS;

EID: 79956046859     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1517403     Document Type: Article

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