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Volumn 80, Issue 23, 2002, Pages 4452-4454

Fermi level unpinning in ex situ Schottky contacts on n-GaAs capped with low-temperature-grown GaAs

Author keywords

[No Author keywords available]

Indexed keywords

AIR EXPOSURE; AS-GROWN; CAPPED LAYER; CONTROL SAMPLES; DEFECT STATE; EX SITU; FERMI-LEVEL UNPINNING; GAAS; HIGH-FREQUENCY CAPACITANCE-VOLTAGE MEASUREMENTS; INTERFACE BARRIER; LAYER STRUCTURES; LOW-TEMPERATURE-GROWN GAAS; METAL WORK FUNCTION; SCHOTTKY BARRIERS; SCHOTTKY CONTACTS;

EID: 79956033351     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1484243     Document Type: Article
Times cited : (18)

References (18)
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    • (2001)
    • Howell, S.1
  • 11
    • 79957931742 scopus 로고    scopus 로고
    • Ph.D. thesis, Purdue University, West Lafayette, IN
    • N.-P. Chen, Ph.D. thesis, Purdue University, West Lafayette, IN, 2001.
    • (2001)
    • Chen, N.-P.1
  • 15
    • 36149025707 scopus 로고
    • phr PHRVAO 0031-899X
    • J. Bardeen, Phys. Rev. 71, 717 (1947). phr PHRVAO 0031-899X
    • (1947) Phys. Rev. , vol.71 , pp. 717
    • Bardeen, J.1
  • 17
    • 0001597428 scopus 로고
    • prl PRLTAO 0031-9007
    • J. Tersoff, Phys. Rev. Lett. 52, 465 (1984). prl PRLTAO 0031-9007
    • (1984) Phys. Rev. Lett. , vol.52 , pp. 465
    • Tersoff, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.