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Volumn 80, Issue 23, 2002, Pages 4452-4454
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Fermi level unpinning in ex situ Schottky contacts on n-GaAs capped with low-temperature-grown GaAs
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AIR EXPOSURE;
AS-GROWN;
CAPPED LAYER;
CONTROL SAMPLES;
DEFECT STATE;
EX SITU;
FERMI-LEVEL UNPINNING;
GAAS;
HIGH-FREQUENCY CAPACITANCE-VOLTAGE MEASUREMENTS;
INTERFACE BARRIER;
LAYER STRUCTURES;
LOW-TEMPERATURE-GROWN GAAS;
METAL WORK FUNCTION;
SCHOTTKY BARRIERS;
SCHOTTKY CONTACTS;
FERMI LEVEL;
GALLIUM ARSENIDE;
MOLECULAR BEAM EPITAXY;
SCHOTTKY BARRIER DIODES;
WORK FUNCTION;
SEMICONDUCTING GALLIUM;
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EID: 79956033351
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1484243 Document Type: Article |
Times cited : (18)
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References (18)
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