Optical absorption measurements of silica containing Si nanocrystals produced by ion implantation and thermal annealing

Applied Physics Letters

Volumn 80, Issue 8, 2002, Pages 1325-1327

  Elliman, R G ^a   Lederer, M J ^a   Luther Davies, B ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FLUENCES; OPTICAL ABSORPTION MEASUREMENT; REFRACTIVE INDEX PROFILES; SI IONS; SI NANOCRYSTAL; THERMAL-ANNEALING;

ABSORPTION SPECTRA; ION IMPLANTATION; LIGHT ABSORPTION; REFRACTIVE INDEX; SILICA; SILICON;

NANOCRYSTALS;

EID: 79956028753     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1454217     Document Type: Article

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