Sensitive detection of voids in solid materials by refraction-enhanced synchrotron radiation imaging

Applied Physics Letters

Volumn 81, Issue 14, 2002, Pages 2559-2560

  Imamura, Keiko ^a   Ehara, Norishige ^a   Umetani, Keiji ^a   Miyamoto, Keiko ^a   Kanemaki, Yoshihide ^a   Uesugi, Kentarou ^a   Inada, Yoichi ^a   Ogata, Haruki ^a   Nakajima, Yasuo ^a   Fukuda, Mamoru ^a  

^a ST MARIANNA UNIVERSITY SCHOOL OF MEDICINE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AIR BUBBLES; IN-SITU; MATRIX; OPAQUE MATERIALS; OPTICAL INSPECTION; PLASTIC MATERIALS; REFRACTION ENHANCEMENTS; SENSITIVE DETECTION; SOLID MATERIAL; SYNCHROTRON RADIATION IMAGING; X RAY INTENSITY;

IMAGING TECHNIQUES; INCLUSIONS; OPTICAL TESTING; RADIOLOGY; REFRACTION; SYNCHROTRONS; X RAY RADIOGRAPHY;

SYNCHROTRON RADIATION;

EID: 79956017543     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1510585     Document Type: Article

References (5)

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4. Images in 16 bit-depth were archived as TIFF format, and signal intensity on an image was measured by using an image processing software IPLab (Scanalytics, Billerica, VA).
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