Erratum: Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping (Appl. Phys. Lett. (2002) 80 (3913))

Applied Physics Letters

Volumn 81, Issue 18, 2002, Pages 3500-

  Pereira, S ^a,b   Correia, M R ^a   Pereira, E ^a   O'Donnell, K P ^b   Alves, E ^c   Sequeira, A D ^c   Franco, N ^c   Watson, I M ^b   Deatcher, C J ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

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EID: 79956014302     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1519670     Document Type: Erratum

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