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Volumn 80, Issue 6, 2002, Pages 1067-1069

Stable bit formation in polyimide Langmuir-Blodgett film using an atomic force microscope

(2)  Yano, K a   Ikeda, T a  


Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; ATOMIC FORCE MICROSCOPES; AU(111) SURFACES; ERROR RATE; MEMORY SYSTEMS; NANO-METER SCALE; SCANNING PROBE MICROSCOPE; TRANSITION TIME; VOLTAGE APPLICATIONS;

EID: 79956013271     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1447007     Document Type: Article
Times cited : (21)

References (14)
  • 5
  • 13
    • 79957967910 scopus 로고    scopus 로고
    • T. Ikeda, T. Kawasaki, H. Kawada, K. Takimoto, K. Eguchi, and T. Nakagiri (unpublished).
    • T. Ikeda, T. Kawasaki, H. Kawada, K. Takimoto, K. Eguchi, and T. Nakagiri (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.