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Volumn 80, Issue 7, 2002, Pages 1150-1152
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Investigation of nanoscale structure in digital layers of Mn/GaAs and MnGa/GaAs
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALL DIGITAL;
GAAS;
GRAZING INCIDENCE;
HIGH-CRYSTALLINE QUALITY;
LAYER THICKNESS;
LOW TEMPERATURE MOLECULAR BEAM EPITAXY;
MAGNETIC LAYERS;
MAGNETIZATION MEASUREMENTS;
MICROSCOPIC STRUCTURES;
NANOSCALE STRUCTURE;
SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRY;
XRD;
GALLIUM ARSENIDE;
MAGNETIC PROPERTIES;
MANGANESE;
MONOLAYERS;
QUANTUM INTERFERENCE DEVICES;
SEMICONDUCTING GALLIUM;
SQUIDS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
NANOMAGNETICS;
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EID: 79955997668
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1448658 Document Type: Article |
Times cited : (12)
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References (13)
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