SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 12, 2002, Pages 2108-2110

Characteristics of high-quality p-type AlxGa1-xN/GaN superlattices

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE SPECTROSCOPIES; AL COMPOSITION; HALL MEASUREMENTS; HIGH QUALITY; METAL-ORGANIC VAPOR PHASE EPITAXY; P-TYPE;

ALUMINUM; ELECTRIC PROPERTIES; GALLIUM; HOLE CONCENTRATION;

SUPERLATTICES;

EID: 79955992474 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1463708 Document Type: Article

Times cited : (23)

References (11)

1
- 0030574949
- apl APPLAB 0003-6951
- S. Nakamura, M. Senoh, S. Nagahara, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, Appl. Phys. Lett. 68, 2105 (1996). apl APPLAB 0003-6951
- (1996) Appl. Phys. Lett. , vol.68 , pp. 2105
- Nakamura, S.¹ Senoh, M.² Nagahara, S.³ Iwasa, N.⁴ Yamada, T.⁵ Matsushita, T.⁶ Kiyoku, H.⁷ Sugimoto, Y.⁸

2
- 5944240962
- apl APPLAB 0003-6951
- D. Walker, X. Zhang, A. Saxler, P. Kung, J. Xu, and M. Razeghi, Appl. Phys. Lett. 70, 949 (1997). apl APPLAB 0003-6951
- (1997) Appl. Phys. Lett. , vol.70 , pp. 949
- Walker, D.¹ Zhang, X.² Saxler, A.³ Kung, P.⁴ Xu, J.⁵ Razeghi, M.⁶

3
- 0032092120
- jjc JAPLD8 0021-4922
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matushita, Y. Sugimoto, T. Kozaki, H. Umemoto, M. Sano, and K. Chocho, Jpn. J. Appl. Phys., Part 2 37, L627 (1998). jjc JAPLD8 0021-4922
- (1998) Jpn. J. Appl. Phys., Part 2 , vol.37 , pp. 627
- Nakamura, S.¹ Senoh, M.² Nagahama, S.³ Iwasa, N.⁴ Yamada, T.⁵ Matushita, T.⁶ Sugimoto, Y.⁷ Kozaki, T.⁸ Umemoto, H.⁹ Sano, M.¹⁰ Chocho, K.¹¹

4
- 79958213595
- U.S. Patent No. 5831277 (March 19)
- M. Razeghi, U.S. Patent No. 5831277 (March 19, 1997).
- (1997)
- Razeghi, M.¹

5
- 0642275027
- prb PRBMDO 0163-1829
- F. Bernardini, V. Fiorentini, and D. Vanderbilt, Phys. Rev. B 56, 10024 (1997). prb PRBMDO 0163-1829
- (1997) Phys. Rev. B , vol.56 , pp. 10024
- Bernardini, F.¹ Fiorentini, V.² Vanderbilt, D.³

6
- 0032613581
- apl APPLAB 0003-6951
- P. Kozodoy, M. Hansen, S. P. DenBaars, and U. K. Mishra, Appl. Phys. Lett. 74, 3681 (1999). apl APPLAB 0003-6951
- (1999) Appl. Phys. Lett. , vol.74 , pp. 3681
- Kozodoy, P.¹ Hansen, M.² Denbaars, S.P.³ Mishra, U.K.⁴

7
- 0033690224
- jjb JAPNDE 0021-4922
- K. Kamakura, T. Makimoto, and N. Kobayashi, Jpn. J. Appl. Phys., Part 1 39, 2428 (2000). jjb JAPNDE 0021-4922
- (2000) Jpn. J. Appl. Phys., Part 1 , vol.39 , pp. 2428
- Kamakura, K.¹ Makimoto, T.² Kobayashi, N.³

8
- 79958243204
- Here, we have neglected the effects of threading dislocations on the elastic constants of the material
- Here, we have neglected the effects of threading dislocations on the elastic constants of the material.

9
- 0001590229
- jaJAPIAU 0021-8979
- O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman, R. Dimitrov, L. Wittmer, M. Stutzmann, W. Rieger, and J. Hilsenbeck, J. Appl. Phys. 85, 3222 (1999). jap JAPIAU 0021-8979
- (1999) J. Appl. Phys. , vol.85 , pp. 3222
- Ambacher, O.¹ Smart, J.² Shealy, J.R.³ Weimann, N.G.⁴ Chu, K.⁵ Murphy, M.⁶ Schaff, W.J.⁷ Eastman, L.F.⁸ Dimitrov, R.⁹ Wittmer, L.¹⁰ Stutzmann, M.¹¹ Rieger, W.¹² Hilsenbeck, J.¹³

10
- 0000593832
- jaJAPIAU 0021-8979
- D. Seghier and H. P. Gislason, J. Appl. Phys. 88, 6483 (2000). jap JAPIAU 0021-8979
- (2000) J. Appl. Phys. , vol.88 , pp. 6483
- Seghier, D.¹ Gislason, H.P.²

11
- 21544440405
- apl APPLAB 0003-6951
- J. W. Huang, T. F. Kuech, H. Lu, and I. Bhat, Appl. Phys. Lett. 68, 2392 (1996). apl APPLAB 0003-6951
- (1996) Appl. Phys. Lett. , vol.68 , pp. 2392
- Huang, J.W.¹ Kuech, T.F.² Lu, H.³ Bhat, I.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.