Erratum: Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432))

Applied Physics Letters

Volumn 80, Issue 2, 2002, Pages 337-

  Pereira, S ^a   Correia, M R ^b   Pereira, E ^b   O'Donnell, K P ^a   Alves, E ^a   Sequeira, A D ^c   Franco, N ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

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EID: 79955990877     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1430029     Document Type: Erratum

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