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Applied Physics Letters

Volumn 80, Issue 6, 2002, Pages 1022-1024

Submicron YBa2Cu3Ox ramp Josephson junctions

(4) Komissinski, Philippe V a Högberg, Björn a Tzalenchuk, Alexander Ya a Ivanov, Zdravko a

a CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS CARBON (A-C); CHARACTERISTIC VOLTAGES; CRYSTAL DIRECTION; E-BEAM LITHOGRAPHY; EXCESS CURRENT; ION MILLING; JOSEPHSON JUNCTIONS; ORDER PARAMETER; RESISTIVELY SHUNTED JUNCTIONS; SUBMICRON; SUBMICRON BRIDGES; SUBMICRON JUNCTIONS;

AMORPHOUS CARBON; CRYSTAL ORIENTATION; JOSEPHSON JUNCTION DEVICES;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 79955987135 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1448176 Document Type: Article

Times cited : (13)

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