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Volumn , Issue , 2011, Pages 281-286

Using data analysis for discovering improvement potentials in production process

Author keywords

[No Author keywords available]

Indexed keywords

ASSISTANCE SYSTEM; DATA ANALYSIS; DATA INTEGRATION; DYNAMIC BAYESIAN NETWORK; HEAT TREATMENT PROCESS; INDICATOR SYSTEM; INFORMATION QUALITY; KNOWLEDGE-BASED METHODS; PROCEDURAL KNOWLEDGE; PRODUCT GENERATION; PRODUCT LIFE CYCLES; PRODUCTION PROCESS; RELATED PRODUCTS; STEEL INDUSTRY; TECHNICAL PRODUCTS; USE PHASE;

EID: 79955930976     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2011.5754388     Document Type: Conference Paper
Times cited : (4)

References (31)
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    • Bayesian Networks of Customer Satisfaction Survey Data
    • November 2009
    • S. Salini and R. S. Kenett: Bayesian Networks of Customer Satisfaction Survey Data. Journal of Applied Statistics, Volume 36, Issue 11 November 2009, pages 1177-1189, 2009.
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    • Salini, S.1    Kenett, R.S.2
  • 18
    • 84893236755 scopus 로고    scopus 로고
    • John Wiley & Sons, Ltd. The Atrium, Southern Gate, Chichester, West Sussex, PO19 8SQ, United Kingdom
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    • (2009) Bayesian Networks - An Introduction
    • Koski, T.1    Noble, J.M.2
  • 20
    • 0003448310 scopus 로고    scopus 로고
    • Statistics for Engineering and Information Science, Springer-Verlag, Berlin Heidelberg New York, 2nd Edition
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    • (2007) Bayesian Networks and Decision Graphs
    • Jensen, F.V.1    Nielsen, T.2
  • 25
    • 0032839653 scopus 로고    scopus 로고
    • Combining Probability Distributions from Experts in Risk Analysis
    • R. T. Clemen, R. L. Winkler: Combining Probability Distributions from Experts in Risk Analysis. In: Risk Analysis 19(2): 187-203, 1999.
    • (1999) Risk Analysis , vol.19 , Issue.2 , pp. 187-203
    • Clemen, R.T.1    Winkler, R.L.2
  • 28
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    • 10 Potholes in the Road to Information Quality
    • D. M. Strong, Y. W. Lee and R.Y. Wang: 10 Potholes in the Road to Information Quality, in: Computer IEEE, 30(8), pp. 38-46, 1997.
    • (1997) Computer IEEE , vol.30 , Issue.8 , pp. 38-46
    • Strong, D.M.1    Lee, Y.W.2    Wang, R.Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.