The influence of cultivar and plant architecture on yield loss

Biotic Stress and Yield Loss

Volumn , Issue , 2000, Pages 99-116

  Haile, Fikru J ^a  

^a DOW AGROSCIENCES LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79955901770     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1201/9781420040753     Document Type: Chapter

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