Single-crystal investigations on quaternary clathrates Ba 8Cu 5Si x Ge 41-x (x = 6, 18, 41)

Journal of Electronic Materials

Volumn 40, Issue 5, 2011, Pages 589-596

  Yan, X ^a,b   Grytsiv, A ^b   Giester, G ^b   Bauer, E ^a   Rogl, P ^b   Paschen, S ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

cage size; Clathrate; single crystal x ray diffraction; thermal expansion coefficient

Indexed keywords

BONDING CHARACTER; CAGE SIZES; CLATHRATE; CLATHRATES; EINSTEIN TEMPERATURE; LATTICE THERMAL CONDUCTIVITY; LINEAR THERMAL EXPANSION COEFFICIENTS; SINGLE-CRYSTAL X-RAY DIFFRACTION; STATIC DISORDER; STRUCTURAL CHARACTERISTICS; TEMPERATURE RANGE; THERMAL EXPANSION COEFFICIENT; THERMOELECTRIC MATERIAL; TYPE-I CLATHRATE;

BARIUM; CRYSTAL SYMMETRY; DEBYE TEMPERATURE; DIFFRACTION; GERMANIUM; HYDRATES; RIETVELD REFINEMENT; THERMAL CONDUCTIVITY; THERMAL EXPANSION; THERMOELECTRICITY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL ATOMIC STRUCTURE;

EID: 79955895794     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1464-1     Document Type: Conference Paper

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