Ultra-low dark count rate and high system efficiency single-photon detectors with 50 nm-wide superconducting wires

Applied Physics B: Lasers and Optics

Volumn 102, Issue 4, 2011, Pages 867-871

  Zhang, L ^a   Kang, L ^a   Chen, J ^a   Zhong, Y ^a   Zhao, Q ^a   Jia, T ^a   Cao, C ^a   Jin, B ^a   Xu, W ^a   Sun, G ^a   Wu, P ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBANCES; COMMUNICATION WAVELENGTHS; CRITICAL PARAMETER; DARK COUNT RATE; DETECTION EFFICIENCY; FILM DEFECTS; INFRARED PHOTONS; NBN NANOWIRE; SINGLE-PHOTON DETECTORS; SUPERCONDUCTING NANOWIRE; SYSTEM EFFICIENCY; THERMAL ACTIVATION; WAVELENGTH RESPONSE;

DETECTORS; ELECTRIC WIRE; MULTIPHOTON PROCESSES; NANOWIRES; PARTICLE BEAMS; PHOTODETECTORS; SUPERCONDUCTIVITY; THICK FILMS;

PHOTONS;

EID: 79955891849     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-010-4234-0     Document Type: Article

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