Curvature effect on nanometer-scale surface properties of phospholipid layers

Colloids and Surfaces B: Biointerfaces

Volumn 86, Issue 1, 2011, Pages 166-168

  Park, Jin Won ^a  

^a Seoul National University of Science and Technology   (South Korea)

Author keywords

AFM; Curvature; Phospholipid layer; Surface forces

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; CURVATURE; CURVATURE EFFECT; DIOLEOYLPHOSPHATIDYLCHOLINE; DIPALMITOYL PHOSPHATIDYLCHOLINE; LIPID LAYERS; LIPID MOLECULES; LIPOSOME FUSION; NANO-METER-SCALE; OCTADECYLTRIMETHOXYSILANE; PHOSPHOLIPID BILAYER; SHORT-RANGE REPULSION; SILICA SPHERE; SURFACE CURVATURES; SURFACE FORCES;

ATOMIC FORCE MICROSCOPY; MECHANICAL STABILITY; SILICA; SURFACE PROPERTIES;

PHOSPHOLIPIDS;

DILEOYLPHOSPHATIDYLCHOLINE; DIPALMITOYLPHOSPHATIDYLCHOLINE; GLYCEROPHOSPHOLIPID; LIPOSOME; SILICON; SILICON DIOXIDE; UNCLASSIFIED DRUG; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; HYDROLYSIS; HYDROPHOBICITY; PHOSPHOLIPID BILAYER; PRIORITY JOURNAL; TEMPERATURE;

MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; PHOSPHOLIPIDS; SURFACE PROPERTIES;

EID: 79955834548     PISSN: 09277765     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfb.2011.03.036     Document Type: Article

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