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Volumn , Issue , 2010, Pages

3D Packaging Technology: Enabling the next wave of applications

Author keywords

[No Author keywords available]

Indexed keywords

3D PACKAGING; ELECTRONIC PRODUCT; EXPECTED VALUES; HETEROGENEOUS TECHNOLOGY; MEGATRENDS; PACKAGING TECHNOLOGIES; POWER MANAGEMENTS; SEMICONDUCTOR INDUSTRY; SMART ELECTRONICS; STORAGE DEVICES; SYSTEM IN PACKAGE; THROUGH SILICON VIAS; VALUE ADDED APPLICATIONS; VOLUME PRODUCTION;

EID: 79955760667     PISSN: 10898190     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMT.2010.5746735     Document Type: Conference Paper
Times cited : (9)

References (5)
  • 3
    • 79955759111 scopus 로고    scopus 로고
    • Texas Instruments Las Vegas, Nevada
    • Bolanos, Mario, Texas Instruments. Con Fab Conference, Las Vegas, Nevada, 2010
    • (2010) Con Fab Conference
    • Bolanos, M.1
  • 4
    • 79955776517 scopus 로고    scopus 로고
    • Power integrity analysis and management for integrated circuits
    • Texas Instruments by Raj Nair and Donald Bennett (ISBN 0137011229) (Prentice Hall Professional), Ch. 10
    • Bolanos, Mario, Texas Instruments. "Power Integrity Analysis and Management for Integrated Circuits" by Raj Nair and Donald Bennett (ISBN 0137011229), Pearson Education (Prentice Hall Professional), Ch. 10.
    • Pearson Education
    • Bolanos, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.