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Volumn 31, Issue 9, 2011, Pages 30-35

IGBT open circuit fault diagnosis method for inverter

Author keywords

Fault diagnosis; IGBT open circuit; Inverter

Indexed keywords

FOURIER TRANSFORMS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PARKS;

EID: 79955650152     PISSN: 02588013     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (51)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.