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Volumn 47, Issue 4, 2011, Pages 67-71
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Amorphous-silicon bolometers could surpass IR focal-plane technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
CONSTANT VOLTAGE;
FOCAL PLANES;
HIGH EFFICIENCY;
IR IMAGING;
MICRO-BOLOMETERS;
MICROBOLOMETER ARRAYS;
MODE OF OPERATIONS;
PIXEL SIZE;
SIGNAL CURRENT;
SILICON BOLOMETERS;
TECHNOLOGY-BASED;
TEXAS INSTRUMENTS;
THERMAL ISOLATION;
THERMAL MASS;
UNIT CELLS;
BOLOMETERS;
INFRARED DETECTORS;
INFRARED IMAGING;
PIXELS;
TECHNOLOGY;
TEMPERATURE SENSORS;
VANADIUM;
AMORPHOUS SILICON;
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EID: 79955605801
PISSN: 10438092
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (4)
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References (0)
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