Note: Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

Review of Scientific Instruments

Volumn 82, Issue 4, 2011, Pages

  Chavan, D ^a   Andres, D ^b   Iannuzzi, D ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b ATTOCUBE SYSTEMS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; ATOMIC FORCE MICROSCOPES; CONTACT MODE ATOMIC FORCE MICROSCOPY; CRYOGENIC TEMPERATURES; LOW TEMPERATURES; TAPPING MODES;

ATOMIC FORCE MICROSCOPY;

EID: 79955586941     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3579496     Document Type: Article

References (12)

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2. D. Iannuzzi, S. Deladi, M. Slaman, J. H. Rector, H. Schreuders, and M. C. Elwenspoek, Sens. Actuators B 121, 706 (2007). 10.1016/j.snb.2006.03.049 (Pubitemid 46186881)
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10. In Ref. 8, we made use of a single bore glass ferrule where we first ablated a v-groove to accommodate the etched fiber. The use of custom made double-bore glass ferrules eliminates the fabrication of v-groove, and thus further simplifies the fabrication process.
11. http://www.attocube.com/nanoSCOPYxs/afmIxs.htm.
12. D. Rugar, H. J. Mamin, and P. Guethner, Appl. Phys. Lett. 55, 2588 (1989). 10.1063/1.101987