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Volumn 33, Issue 7, 2011, Pages 1024-1027

Enhanced 1G4 emission in NaLaF4: Pr 3+, Yb3+ and charge transfer in NaLaF4: Ce 3+, Yb3+ studied by fourier transform luminescence spectroscopy

(5) Van Der Kolk, E a Ten Kate, O M a Wiegman, J W a Biner, D b Kramer K W b

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

b UNIVERSITY OF BERN (Switzerland)

Author keywords

Down conversion; Quantum cutting; Spectral conversion

Indexed keywords

CHARGE TRANSFER; ENERGY TRANSFER; GALLIUM ALLOYS; GALLIUM COMPOUNDS; INDIUM ALLOYS; LUMINESCENCE; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR ALLOYS;

CHARGE TRANSFER PROCESS; DOWN CONVERSION; HIGH RESOLUTION; INGAAS DETECTORS; LUMINESCENCE SPECTROSCOPY; LUMINESCENCE STUDIES; QUANTUM CUTTING; SPECTRAL CONVERSION;

YTTERBIUM ALLOYS;

EID: 79955548654 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2010.08.010 Document Type: Conference Paper

Times cited : (37)

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