Hitachi advanced X-ray computed tomography system for digital engineering

Virtual Modelling and Rapid Manufacturing - Advanced Research in Virtual and Rapid Prototyping

Volumn , Issue , 2003, Pages

  Kitazawa, So ^a   Nukaga, Jun ^a   Kamimura, Hiroshi ^a   Sato, Katsutoshi ^b  

^a HITACHI LTD   (Japan)

^b Mitsubishi Hitachi Power Systems Ltd   (Japan)

Author keywords

Computed tomography; Digital engineering; Monte Carlo simulation; Semiconductor detector; X ray

Indexed keywords

COMPUTED TOMOGRAPHY; CROSSTALK NOISE; DENSITY RESOLUTION; DIGITAL ENGINEERING; ELECTRON LINEAR ACCELERATOR; HIGH ENERGY; HIGH-PRECISION; HIGHLY SENSITIVE; HITACHI; MONTE CARLO SIMULATION; OBJECT SIZE; OUTPUT SIGNAL; SCANNING SPEED; SCANNING TIME; SCATTERED X-RAYS; SPATIAL RESOLUTION; SYSTEM ARCHITECTURES; X-RAY COMPUTED TOMOGRAPHY SYSTEM;

COMPUTER SIMULATION; COMPUTERIZED TOMOGRAPHY; CROSSTALK; INDUSTRIAL RESEARCH; MONTE CARLO METHODS; PRECISION ENGINEERING; RAPID PROTOTYPING; SCANNING; TUNGSTEN; X RAYS;

SEMICONDUCTOR DETECTORS;

EID: 79955489046     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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