Admittance measurement for a quantum point contact in multiterminal quantum hall device

Japanese Journal of Applied Physics

Volumn 50, Issue 4 PART 2, 2011, Pages

  Washio, Kazuhisa ^a   Hashisaka, Masayuki ^a   Kamata, Hiroshi ^a,b   Muraki, Koji ^b   Fujisawa, Toshimasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE MEASUREMENTS; EDGE CHANNELS; IMAGINARY PARTS; LOW FREQUENCY; MULTI TERMINALS; MULTI-TERMINAL MEASUREMENT; QUANTUM HALL DEVICES; QUANTUM HALL SYSTEMS; QUANTUM POINT CONTACT; REAL PART; TIME RESOLVED TECHNIQUE;

HALL EFFECT DEVICES; QUANTUM CHEMISTRY; STEREOCHEMISTRY;

POINT CONTACTS;

EID: 79955452947     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.04DJ04     Document Type: Article

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