Evaluating the resistivity-temperature relationship for RTDs and other conductors

IEEE Sensors Journal

Volumn 11, Issue 5, 2011, Pages 1208-1213

  Lacy, Fred ^a  

^a SOUTHERN UNIVERSITY   (United States)

Author keywords

Callendarvan Dusen; conductivity; mean free path; resistance temperature detector (RTD); temperature sensor

Indexed keywords

BULK CONDUCTORS; CALLENDARVAN DUSEN; CONDUCTIVITY; ELECTRICAL RESISTIVITY; EXPERIMENTAL DATA; EXPERIMENTAL EVIDENCE; LINEAR FUNCTIONS; LINEAR RELATIONSHIPS; MEAN FREE PATH; MICROSCOPIC MODELS; QUANTUM MECHANICS; RESISTANCE TEMPERATURE DETECTOR (RTD); RESISTANCE TEMPERATURE DETECTORS; THEORETICAL FRAMEWORK; THEORETICAL MODELS;

DETECTORS; ELECTRIC CONDUCTIVITY; PLATINUM; QUANTUM THEORY; RESONANT TUNNELING; TEMPERATURE SENSORS;

TEMPERATURE MEASURING INSTRUMENTS;

EID: 79955451639     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2010.2089977     Document Type: Article

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