SCOPUS 정보 검색 플랫폼

Volumn 109, Issue 7, 2011, Pages

Phase-resolved x-ray ferromagnetic resonance measurements in fluorescence yield

(12) Marcham, M K a Keatley, P S a Neudert, A b Hicken, R J a Cavill, S A c Shelford, L R c Van Der Laan, G c Telling, N D d Childress, J R e Katine, J A e Shafer, P f Arenholz, E f

a UNIVERSITY OF EXETER (United Kingdom)

b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH (Germany)

c DIAMOND LIGHT SOURCE LTD (United Kingdom)

d KEELE UNIVERSITY (United Kingdom)

e SAN JOSE RESEARCH CENTER (United States)

f LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; CONTINUOUS WAVE; ELEMENT SPECIFIC; FERROMAGNETIC RESONANCE MEASUREMENTS; FLUORESCENCE YIELD; MAGNETIZATION DYNAMICS; MICROWAVE EXCITATIONS; OPAQUE SUBSTRATES; STATIC BIAS; X-RAY ENERGIES; X-RAY MAGNETIC CIRCULAR DICHROISM;

DICHROISM; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; FERROMAGNETISM; FLUORESCENCE; MAGNETIC SUSCEPTIBILITY; RESONANCE; SPECTROSCOPY;

X RAYS;

EID: 79955447811 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3567143 Document Type: Conference Paper

Times cited : (41)

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