Bias-error reduction in nanometer resolution microscopic motion tracking vision systems

International Journal of Precision Engineering and Manufacturing

Volumn 12, Issue 2, 2011, Pages 267-274

  Kim, Jung Hyun ^a  

^a Kyungsung University   (South Korea)

Author keywords

Bias error; Image registration; Motion tracking; Template matching; Vision system

Indexed keywords

EID: 79955441424     PISSN: 12298557     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12541-011-0036-5     Document Type: Article

References (23)

1. Brown L., "A survey of image registration techniques," ACM Comput. Surv., Vol. 24, No. 4, pp. 325-376, 1992.
2. Roesgen, T., "Optimal subpixel interpolation in particle image velocimetry," Experiments in Fluids, Vol. 35, No. 3, pp. 252-256, 2003.
3. Tian, Q. and Huhns, M., "Algorithms for subpixel registration," Computer Vision Graphics and Image Processing, Vol. 35, No. 2, pp. 220-233, 1986.
4. Robinson, D. and Milanfar, P., "Fundamental Performance Limits in Image Registration," IEEE Trans. Image Processing, Vol. 13, No. 9, pp. 1185-1199, 2004.
5. Davis, C. Q. and Freeman, D.M., "Statistics of subpixel registration algorithms based on spatiotemporal gradients or block matching," Opt. Eng., Vol. 37, No. 4, pp. 1290-1298, 1998.
6. Kearney, J., Thompson, W. and Boley, D., "Optical flow estimation: An error analysis of gradient-based methods with local optimization," IEEE Trans. Pattern Anal. Machine Intell., Vol. 9, No. 2, pp. 229-244, 1987.
7. Brandt, J.W., "Analysis of bias in gradient-based optical flow estimation," Proc. of IEEE Asilomar Conf. Signals, Systems and Computers, Vol. 1, pp. 721-725, 1994.
8. Dvornychenko, V., "Bounds on (determinisitic) correlation functions with applications to registration," IEEE Trans. Pattern Anal. Machine Intell., Vol. 5, No. 2, pp. 206-213, 1983.
9. Moddemeijer, R., "On the determination of the position of extrema of sampled correlators," IEEE Trans. Signal Processing, Vol. 39, No. 1, pp. 216-219, 1991.
10. Shimizu, M. and Okutomi, M., "Two-Dimensional Simultaneous Sub-pixel Estimation for Area-Based Matching," Systems and Computers in Japan, Vol. 36, No. 2, pp. 1-11, 2005.
11. Shimizu, M. and Okutomi, M., "Precise sub-pixel estimation on area-based matching," Proc. of IEEE International Conference on Computer Vision, Vol. 1, pp. 90-97, 2001.
12. Giachetti, A., "Matching techniques to compute image motion," Image and Vision Computing, Vol. 18, No. 3, pp. 247-260, 2000.
13. Zitova, B. and Flusser, J., "Image registration methods: a survey," Image and Vision Computing, Vol. 21, No. 11, pp. 977-1000, 2003.
14. Kim, J. H., Kuo, S. K. and Menq, C. H., "An Ultra Precision Six-Axis Visual Servo Control System," IEEE Transactions on Robotics, Vol. 21, No. 5, pp. 985-993, 2005.
15. Kim, J. H. and Menq, C. H., "Visual Servo Control Achieving Nanometer Resolution in X-Y-Z," IEEE Transactions on Robotics, Vol. 25, No. 1, pp. 109-116, 2009.
16. Eastman, R. D., Le Moigne, J. and Netanyahu, N. S., "Research issues in image registration for remote sensing," Proc. of IEEE Conference on Computer Vision and Pattern Recognition, pp. 1-8, 2007.
17. Fonseca, L. M. G. and Manjunath, B. S., "Registration techniques for multisensor remotely sensed imagery," Photogrammetric Engineering and Remote Sensing, Vol. 62, No. 9, pp. 1049-1056, 1996.
18. Costa, C. E. and Petrou, M., "Automatic registration of ceramic tiles for the purpose of fault detection," Machine Vision an Applications, Vol. 11, No. 5, pp. 225-230, 2000.
19. Dom, B. and Brecher, V., "Recent advances in the automatic inspection of integrated circits for pattern defects," Machine Vision Appl., Vol. 8, No. 1, pp. 5-19, 1995.
20. Rao, A. R., "Future directions in industrial machine vision: a case study of semiconductor applicationsm," Image and Vision Computing, Vol. 14, No. 1, pp. 3-19, 1996.
21. Sawada, R., Higurashi, E. and Ito, T., "Highly accurate and quick bonding of a laser-diode chip onto a planar lightwave circuit," Precision Engineering, Vol. 25, No. 4, pp. 293-300, 2001.
22. Zhang, Z. and Menq, C., "Three-Dimensional Particle Tracking with Subnanometer Resolution Using Off-Focus Images," Applied Optics, Vol. 47, No. 13, pp. 2361-2370, 2008.
23. Ko, K. W., Kim, D. H., Kim, M. Y. and Kim, J.H., "An automatic optical inspection system for inspection of CMOS compact camera module assembly," Int. J. Precis. Eng. Manuf., Vol. 10, No. 5, pp. 67-72, 2009.