Magnetoresistance, critical current density, and magnetic flux pinning mechanism in nickel doped BaFe2As2 single crystals

Journal of Applied Physics

Volumn 109, Issue 7, 2011, Pages

  Shahbazi, M ^a   Wang, X L ^a   Lin, Z W ^b   Zhu, J G ^b   Dou, S X ^a   Choi, K Y ^c  

^a UNIVERSITY OF WOLLONGONG   (Australia)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^c Sogang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ARRHENIUS; FIELD DEPENDENCE; FLUX PINNING BEHAVIOR; IN-FIELD; MAGNETIZATION LOOPS; PEAK EFFECTS; TEMPERATURE RANGE; THERMALLY ACTIVATED; THERMALLY ACTIVATED BEHAVIOR; VERY LOW TEMPERATURES; ZERO MAGNETIC FIELDS;

ELECTRIC RESISTANCE; FLUX PINNING; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETOELECTRONICS; MAGNETORESISTANCE; POINT DEFECTS; SUPERCONDUCTING TRANSITION TEMPERATURE;

SINGLE CRYSTALS;

EID: 79955437227     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3563057     Document Type: Conference Paper

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