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Journal of Applied Physics

Volumn 109, Issue 7, 2011, Pages

Anisotropy measurements of FePt thin films

(5) Richter, H J a Hellwig, O a Florez, S a Brombacher, C a,b Albrecht, M b

a SAN JOSE RESEARCH CENTER (United States)

b CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY MEASUREMENTS; CHEMICAL ORDERING; FEPT THIN FILMS; FIELD DIRECTIONS; FIRST-ORDER; MEASUREMENT ACCURACY; SECOND ORDERS; SPATIAL FLUCTUATION; THOMPSON;

THIN FILMS;

ANISOTROPY;

EID: 79955399443 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3536459 Document Type: Conference Paper

Times cited : (17)

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