CdS microspheres composed of nanocrystals and their photocatalytic activity

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 3, 2011, Pages 2090-2099

  Rengaraj, Selvaraj ^a   Jee, Sun Hee ^b   Venkataraj, Selvaraj ^c   Kim, Younghun ^b   Vijayalakshmi, Selvaraj ^c   Repo, Eveliina ^a   Koistinen, Arto ^a   Sillanpää, Mika ^a,d  

^a UNIVERSITY OF EASTERN FINLAND   (Finland)

^b Kwangwoon University   (South Korea)

^c ANNA UNIVERSITY   (India)

^d LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

CdS microsphere; Characterization; MTBE Degradation; Photocatalysis; Visible Light

Indexed keywords

CADMIUM NITRATE; CDS; CDS NANOCRYSTALS; CUBIC STRUCTURE; DIFFUSED REFLECTANCE; ENERGY-DISPERSIVE X-RAY DIFFRACTION; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; HOLLOW MICROSPHERE; METHYL TERT BUTYL ETHER; ORIENTED AGGREGATION; OSTWALD RIPENING MECHANISM; PHOTO-CATALYTIC; PHOTOCATALYTIC ACTIVITIES; PHOTOCATALYTIC PERFORMANCE; PRECURSOR RATIOS; PROCESS PARAMETERS; REACTION TEMPERATURE; SHELL-LIKE STRUCTURES; SOLUTION-PHASE SYNTHESIS METHODS; SPHERICAL MORPHOLOGIES; TEMPLATE-FREE; THIOACETAMIDE; UV-VISIBLE; VISIBLE LIGHT; XRD; XRD ANALYSIS;

CADMIUM; CADMIUM SULFIDE; CHARACTERIZATION; DETOXIFICATION; MICROSPHERES; MORPHOLOGY; NANOCRYSTALS; OSTWALD RIPENING; PHOTOCATALYSIS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY POWDER DIFFRACTION;

CADMIUM COMPOUNDS;

CADMIUM DERIVATIVE; CADMIUM SULFIDE; ETHER DERIVATIVE; MICROSPHERE; NANOMATERIAL; SULFIDE; TERT BUTYL METHYL ETHER;

ARTICLE; CATALYSIS; CHEMISTRY; CRYSTALLIZATION; ISOLATION AND PURIFICATION; LIGHT; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; RADIATION EXPOSURE; SURFACE PROPERTY; ULTRASTRUCTURE;

CADMIUM COMPOUNDS; CATALYSIS; CRYSTALLIZATION; LIGHT; MATERIALS TESTING; METHYL ETHERS; MICROSPHERES; NANOSTRUCTURES; PARTICLE SIZE; PHOTOCHEMISTRY; SULFIDES; SURFACE PROPERTIES;

EID: 79955393685     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.3760     Document Type: Conference Paper

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