Improved arrayed-waveguide-grating layout avoiding systematic phase errors

Optics Express

Volumn 19, Issue 9, 2011, Pages 8781-8794

  Ismail, Nur ^a   Sun, Fei ^a   Sengo, Gabriel ^a   Wörhoff, Kerstin ^a   Driessen, Alfred ^a   De Ridder, René M ^a   Pollnau, Markus ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; OPTICAL LOSSES; SYSTEMATIC ERRORS; WAVEGUIDES;

DIFFRACTION ORDERS; EXPERIMENTAL CHARACTERIZATION; HIGH-ORDER; INTRINSIC LOSS; PHASE ERROR; POLARIZATION-INSENSITIVE; WAVELENGTH REGIONS; WIDE SPECTRAL RANGE;

ARRAYED WAVEGUIDE GRATINGS;

ARTICLE; ARTIFACT; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; REFRACTOMETRY;

ARTIFACTS; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; REFRACTOMETRY;

EID: 79955390790     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.008781     Document Type: Article

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