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Volumn 5, Issue 4, 2011, Pages 2512-2519

Self-aligned U-gate carbon nanotube field-effect transistor with extremely small parasitic capacitance and drain-induced barrier lowering

Author keywords

carbon nanotube; field effect transistor; high speed circuit; parasitic capacitance; self aligned

Indexed keywords

CARBON NANOTUBE FIELD-EFFECT TRANSISTORS; DRAIN-INDUCED BARRIER LOWERING; ELECTROSTATIC POTENTIALS; FREQUENCY DOMAIN MEASUREMENT; GATE STRUCTURE; HIGH FREQUENCY HF; HIGH FREQUENCY RESPONSE; HIGH REPRODUCIBILITY; HIGH-SPEED CIRCUIT; PARASITIC CAPACITANCE; RF APPLICATIONS; SELF-ALIGNED; SELF-ALIGNED DEVICES; SUBTHRESHOLD SWING;

EID: 79955371244     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn102091h     Document Type: Article
Times cited : (34)

References (29)
  • 2
    • 33947523596 scopus 로고    scopus 로고
    • Electrical Transport Properties and Field-Effect Transistors of Carbon nanotube
    • Dai, H. J.; Javey, A.; Pop, E.; Mann, D.; Lu, Y. Electrical Transport Properties and Field-Effect Transistors of Carbon nanotube NANO: Brief Rep. Rev. 2006, 1, 1-13
    • (2006) NANO: Brief Rep. Rev. , vol.1 , pp. 1-13
    • Dai, H.J.1    Javey, A.2    Pop, E.3    Mann, D.4    Lu, Y.5
  • 3
    • 34948858511 scopus 로고    scopus 로고
    • Carbon-based electronics
    • DOI 10.1038/nnano.2007.300, PII NNANO2007300
    • Avouris, Ph.; Chen, Z. H.; Perebeinos, V. Carbon-Based Electronics Nat. Nanotechnol. 2007, 2, 605-615 (Pubitemid 47525190)
    • (2007) Nature Nanotechnology , vol.2 , Issue.10 , pp. 605-615
    • Avouris, P.1    Chen, Z.2    Perebeinos, V.3
  • 4
    • 72549095100 scopus 로고    scopus 로고
    • Nanotube Electronics for Radiofrequency Applications
    • Rutherglen, C.; Jain, D.; Burke, P. Nanotube Electronics for Radiofrequency Applications Nat. Nanotechnol. 2009, 4, 811-819
    • (2009) Nat. Nanotechnol. , vol.4 , pp. 811-819
    • Rutherglen, C.1    Jain, D.2    Burke, P.3
  • 5
    • 0042991275 scopus 로고    scopus 로고
    • Ballistic carbon nanotube field-effect transistors
    • DOI 10.1038/nature01797
    • Javey, A.; Guo, J.; Wang, Q.; Lundstrom, M.; Dai, H. J. Ballistic Carbon Nanotube Field-Effect Transistor Nature 2003, 424, 654-657 (Pubitemid 36987985)
    • (2003) Nature , vol.424 , Issue.6949 , pp. 654-657
    • Javey, A.1    Guo, J.2    Wang, Q.3    Lundstrom, M.4    Dai, H.5
  • 6
    • 1642487759 scopus 로고    scopus 로고
    • Carbon nanotube field-effect transistors with integrated ohmic contacts and high-κ gate dielectrics
    • DOI 10.1021/nl035185x
    • Javey, A.; Guo, J.; Farmer, D. B.; Wang, Q.; Wang, D. W.; Gordon, R. G.; Lundstrom, M.; Dai, H. J. Carbon Nanotube Field-Effect Transistors with Integrated Ohmic Contacts and High-κ Gate Dielectrics Nano Lett. 2004, 4, 447-450 (Pubitemid 38402631)
    • (2004) Nano Letters , vol.4 , Issue.3 , pp. 447-450
    • Javey, A.1    Guo, J.2    Farmer, D.B.3    Wang, Q.4    Wang, D.5    Gordon, R.G.6    Lundstrom, M.7    Dai, H.8
  • 9
    • 61649099616 scopus 로고    scopus 로고
    • Self-Aligned Ballistic n-Type Single-Walled Carbon Nanotube Field-Effect Transistors with Adjustable Threshold Voltage
    • Zhang, Z. Y.; Wang, S.; Ding, L.; Liang, X. L.; Pei, T.; Shen, J.; Xu, H. L.; Chen, Q.; Cui, R. L.; Li, Y. et al. Self-Aligned Ballistic n-Type Single-Walled Carbon Nanotube Field-Effect Transistors with Adjustable Threshold Voltage Nano Lett. 2008, 8, 3696-3701
    • (2008) Nano Lett. , vol.8 , pp. 3696-3701
    • Zhang, Z.Y.1    Wang, S.2    Ding, L.3    Liang, X.L.4    Pei, T.5    Shen, J.6    Xu, H.L.7    Chen, Q.8    Cui, R.L.9    Li, Y.10
  • 10
    • 4143096759 scopus 로고    scopus 로고
    • Self-aligned ballistic molecular transistors and electrically parallel nanotube arrays
    • DOI 10.1021/nl049222b
    • Javey, A.; Guo, J.; Farmer, D. B.; Wang, Q.; Yenilmez, E.; Gordon, R. G.; Lundstrom, M.; Dai, H. J. Self-aligned Ballistic Molecular Transistors and Electrically Parallel Nanotube Arrays Nano Lett. 2004, 4, 1319-1322 (Pubitemid 39099196)
    • (2004) Nano Letters , vol.4 , Issue.7 , pp. 1319-1322
    • Javey, A.1    Guo, J.2    Farmer, D.B.3    Wang, Q.4    Yenilmez, E.5    Gordon, R.G.6    Lundstrom, M.7    Dai, H.8
  • 12
    • 71949099009 scopus 로고    scopus 로고
    • Y-contacted High-Performance n-Type Single-Walled Carbon Nanotube Field-Effect Transistors: Scaling and Comparison with Sc-contacted Devices
    • Ding, L.; Wang, S.; Zhang, Z. Y.; Zeng, Q. S.; Wang, Z. X.; Pei, T.; Yang, L. J.; Liang, X. L.; Shen, J.; Chen, Q. et al. Y-contacted High-Performance n-Type Single-Walled Carbon Nanotube Field-Effect Transistors: Scaling and Comparison with Sc-contacted Devices Nano Lett. 2009, 9, 4209-4214
    • (2009) Nano Lett. , vol.9 , pp. 4209-4214
    • Ding, L.1    Wang, S.2    Zhang, Z.Y.3    Zeng, Q.S.4    Wang, Z.X.5    Pei, T.6    Yang, L.J.7    Liang, X.L.8    Shen, J.9    Chen, Q.10
  • 14
    • 28444442341 scopus 로고    scopus 로고
    • Assessment of high-frequency performance potential of carbon nanotube transistors
    • DOI 10.1109/TNANO.2005.858601
    • Guo, J.; Hasan, S.; Javey, A.; Bosman, G. Assessment of High-Frequency Performance Potential of Carbon Nanotube Transistors IEEE Trans. Nanotechnol. 2005, 4, 715-721 (Pubitemid 41729632)
    • (2005) IEEE Transactions on Nanotechnology , vol.4 , Issue.6 , pp. 715-721
    • Guo, J.1    Hasan, S.2    Javey, A.3    Bosman, G.4    Lundstrom, M.5
  • 16
    • 59049086559 scopus 로고    scopus 로고
    • Circuit-Level Performance Benchmarking and Scalability Analysis of Carbon Nanotube Transistor Circuits
    • Patil, N.; Deng, J.; Mitra, S.; Wong, H.-S. Circuit-Level Performance Benchmarking and Scalability Analysis of Carbon Nanotube Transistor Circuits IEEE Trans. Nanotechnol. 2009, 8, 37-45
    • (2009) IEEE Trans. Nanotechnol. , vol.8 , pp. 37-45
    • Patil, N.1    Deng, J.2    Mitra, S.3    Wong, H.-S.4
  • 19
    • 64549151943 scopus 로고    scopus 로고
    • A 32nm Logic Technology Featuring 2nd-Generation High-k + Metal-Gate Transistors, Enhanced Channel Strain and 0.171μm2 SRAM Cell Size in a 291Mb Array
    • Natarajan, S.; Armstrong, M.; bost, M.; Brain, R.; Brazier, M.; Chang, C. H.; Chikarmane, V.; Childs, M.; Deshpande, H.; Dev, K. et al. A 32nm Logic Technology Featuring 2nd-Generation High-k + Metal-Gate Transistors, Enhanced Channel Strain and 0.171μm2 SRAM Cell Size in a 291Mb Array IEDM 2008, 4796777
    • (2008) IEDM , pp. 4796777
    • Natarajan, S.1    Armstrong, M.2    Bost, M.3    Brain, R.4    Brazier, M.5    Chang, C.H.6    Chikarmane, V.7    Childs, M.8    Deshpande, H.9    Dev, K.10
  • 20
    • 34547379439 scopus 로고    scopus 로고
    • Ultrahigh frequency carbon nanotube transistor based on a single nanotube
    • DOI 10.1109/TNANO.2007.901179
    • Wang, D.; Yu, Z.; McKernan, S.; Burke, P. J. Ultrahigh Frequency Carbon Nanotube Transistor Based on a Single Nanotube IEEE Trans. Nanotechnol. 2007, 6, 400-403 (Pubitemid 47153417)
    • (2007) IEEE Transactions on Nanotechnology , vol.6 , Issue.4 , pp. 400-403
    • Wang, D.1    Yu, Z.2    McKernan, S.3    Burke, P.J.4
  • 21
    • 3142671577 scopus 로고    scopus 로고
    • AC Performance of Nanoelectronics: Towards a Ballistic THz Nanotube Transistor
    • Burke, P. AC Performance of Nanoelectronics: Towards a Ballistic THz Nanotube Transistor Solid-State Electron. 2004, 48, 1981-1986
    • (2004) Solid-State Electron. , vol.48 , pp. 1981-1986
    • Burke, P.1
  • 22
    • 79955412234 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (2009 ed.)
    • International Technology Roadmap for Semiconductors (2009 ed.), http://public.itrs.net/.
  • 23
    • 33846396171 scopus 로고    scopus 로고
    • Copper catalyzing growth of single-walled carbon nanotubes on substrates
    • DOI 10.1021/nl061871v
    • Zhou, W. W.; Han., Z. Y.; Wang., J. Y.; Zhang, Y.; Jin, Z.; Sun, X.; Zhang, Y. W.; Yan, C. H.; Li, Y. Copper Catalyzing Growth of Single-Walled Carbon Nanotubes on Substrates Nano Lett. 2006, 6, 2987-2990 (Pubitemid 46129606)
    • (2006) Nano Letters , vol.6 , Issue.12 , pp. 2987-2990
    • Zhou, W.1    Han, Z.2    Wang, J.3    Zhang, Y.4    Jin, Z.5    Sun, X.6    Zhang, Y.7    Yan, C.8    Li, Y.9
  • 25
    • 33749350731 scopus 로고    scopus 로고
    • Measurement of the quantum capacitance of interacting electrons in carbon nanotubes
    • DOI 10.1038/nphys412, PII NPHYS412
    • Ilani, S.; Donev, L. A. K.; Kindermann, M.; McEuen, P. L. Measurement of the Quantum Capacitance of Interacting Electrons in Carbon Nanotubes Nat. Phys. 2006, 2, 687-691 (Pubitemid 44498152)
    • (2006) Nature Physics , vol.2 , Issue.10 , pp. 687-691
    • Ilani, S.1    Donev, L.A.K.2    Kindermann, M.3    McEuen, P.L.4
  • 26
    • 34547255321 scopus 로고    scopus 로고
    • Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment
    • DOI 10.1021/nl070378w
    • Tu, R.; Zhang, L.; Nishi, Y.; Dai, H. J. Measuring the Capacitance of Individual Semiconductor Nanowires for Carrier Mobility Assessment Nano Lett. 2007, 7, 1561-1565 (Pubitemid 47140425)
    • (2007) Nano Letters , vol.7 , Issue.6 , pp. 1561-1565
    • Tu, R.1    Zhang, L.2    Nishi, Y.3    Dai, H.4
  • 27
    • 67049158294 scopus 로고    scopus 로고
    • Dopant Profiling and Surface Analysis of Silicon Nanowires Using Capacitance-Voltage Measurements
    • Garnett, E. C.; Tseng, Y. C.; Khanal, D. R.; Wu, J.; Bokor, J.; Yang, P. D. Dopant Profiling and Surface Analysis of Silicon Nanowires Using Capacitance-Voltage Measurements Nat. Nanotechnol. 2009, 4, 311-314
    • (2009) Nat. Nanotechnol. , vol.4 , pp. 311-314
    • Garnett, E.C.1    Tseng, Y.C.2    Khanal, D.R.3    Wu, J.4    Bokor, J.5    Yang, P.D.6
  • 29
    • 15544387267 scopus 로고    scopus 로고
    • Direct measurements of frequency response of carbon nanotube field effect transistors
    • DOI 10.1049/el:20057528
    • Signh, D. V.; Jenkins, K. A.; Appenzeller, J. Direct Measurements of Frequency Response of Carbon Nanotube Field Effect Transistor Electron. Lett. 2005, 41, 280-282 (Pubitemid 40401905)
    • (2005) Electronics Letters , vol.41 , Issue.5 , pp. 280-282
    • Singh, D.V.1    Jenkins, K.A.2    Appenzeller, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.