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Volumn , Issue , 2011, Pages 63-
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Analyzing architectural conformance of layered aspect-oriented systems with ArchE meter
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Author keywords
AOSD; Metrics; Software engineering
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Indexed keywords
AOSD;
ASPECT-ORIENTED;
METRICS;
SOFTWARE SYSTEMS;
COMPUTER SYSTEMS PROGRAMMING;
SOFTWARE DESIGN;
SOFTWARE ARCHITECTURE;
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EID: 79955130141
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1960314.1960334 Document Type: Conference Paper |
Times cited : (2)
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References (2)
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