Morphology of the cross section of silica layer in rice husk

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 2, 2011, Pages 1305-1309

  Byun, Sung Chun ^a   Jung, In Ok ^a   Kim, Moon Yong ^a   So, Soo Jeong ^a   Yoon, Chan ^a   Kim, Chul ^a   Lei, Guo ^a   Han, Chong Soo ^a  

^a Chonnam National University   (South Korea)

Author keywords

AFM; EDS; Nano pore; Rice husk silica; SEM; STM

Indexed keywords

AFM; ATOMIC FORCE; ATOMIC FORCE MICROSCOPES; BUILDING UNITS; CELLULOSE LAYERS; CROSS SECTION; ENERGY DISPERSIVE; ENERGY DISPERSIVE SPECTROMETERS; EXTERNAL SHAPE; GAS FLOWS; MICROSCOPIC IMAGE; PHYSICAL ADSORPTION; PLATE SURFACES; RICE HUSK; RICE HUSK SILICA; SCANNING ELECTRON MICROSCOPE; SCANNING TUNNELING MICROSCOPES; SILICA LAYERS; SILICA NANOPARTICLES; STM; SUB MICRON; THROUGH HOLE;

ATOMIC FORCE MICROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; GAS ADSORPTION; NANOPARTICLES; OSMIUM; SCANNING ELECTRON MICROSCOPY; SILICA;

CELLULOSE;

CELLULOSE; OSMIUM; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; NANOPORE; NANOTECHNOLOGY; RICE; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SPECTROMETRY; ULTRASTRUCTURE;

CELLULOSE; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, SCANNING TUNNELING; NANOPORES; NANOTECHNOLOGY; ORYZA SATIVA; OSMIUM; SILICON DIOXIDE; SPECTROMETRY, X-RAY EMISSION;

EID: 79955013418     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.3338     Document Type: Conference Paper

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