The fabrication of ordered arrays of exchange biased Ni/FeF2 nanostructures

Nanotechnology

Volumn 21, Issue 17, 2010, Pages

  Kovylina, M ^a   Erekhinsky, M ^b   Morales, R ^c   Schuller, I K ^b   Labarta, A ^a   Batlle, X ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETIC MATERIALS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY;

ANTIFERROMAGNETICS; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; ION BEAM CURRENTS; MAGNETO-TRANSPORT MEASUREMENT; ORDERED ARRAY; REMOVAL DEPTH; SQUARE ARRAY;

FABRICATION;

EID: 79954616029     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/17/175301     Document Type: Article

References (31)

1. For a review see Batlle X and Labarta A 2002 J. Phys. D: Appl. Phys. 35 R15 (Pubitemid 34277046)
2. Fullerton E E and Schuller I K 2007 ACS Nano 1 384
3. For a review see Bader S D 2006 Rev. Mod. Phys. 78 1 (Pubitemid 43279667)
4. For a review see Martín J I, Nogués J, Liu K, Vicent J L and Schuller I K 2003 J. Magn. Magn. Mater. 256 449 and references therein
5. Wolf S and Treger D 2000 IEEE Trans. Magn. 36 2748 (Pubitemid 32384687)
6. Kools J C S 1996 IEEE Trans. Magn. 32 3165
7. Parkin S S P, Jiang X, Kaiser C, Panchula A, Roche K and Samant M 2003 Proc. IEEE 91 661
8. Prinz G A 1998 Science 282 1660
9. Akerman J 2005 Science 308 508 (Pubitemid 40570573)
10. Baibich M N et al 1988 Phys. Rev. Lett. 61 2472
11. Binasch G, Grünberg P, Saurenbach F and Zinn W 1989 Phys. Rev. B 39 4828
12. For a review see Gregg J F, Petej I, Jouguelet E and Dennis C 2002 J. Phys. D: Appl. Phys. 35 R121 (Pubitemid 35167234)
13. Ross C A 2001 Annu. Rev. Mater. Res. 31 203 (Pubitemid 33073850)
14. Giannuzzi L A and Stevie F A 2005 Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice (New York: Springer)
15. Orloff J, Utlaut M and Swanson L 2003 High Resolution Focused Ion Beams: FIB and its Application (New York: Kluwer Academic Plenum)
16. For a review see Nogués J and Schuller I K 1999 J. Magn. Magn. Mater. 192 203
17. Meiklejohn W P and Bean C P 1956 Phys. Rev. 102 1413
18. Meiklejohn W P and Bean C P 1957 Phys. Rev. 105 904
19. For a review see Nogués J, Sort J, Langlais V, Skumryev V, Suriñach S, Muñoz J S and Baró M D 2005 Phys. Rep. 422 65 (Pubitemid 41670331)
20. For a theoretical review see Kiwi M 2001 J. Magn. Magn. Mater. 234 584 (Pubitemid 32833664)
21. For a review see Iglesias O, Labarta A and Batlle X 2008 J. Nanosci. Nanotechnol. 8 2761 (Pubitemid 351594264)
22. Roshchin I V, Petracic O, Morales R, Li Z P, Batlle X and Schuller I K 2005 Europhys. Lett. 71 297 (Pubitemid 41024885)
23. Petracic O, Li Z-P, Roshchin I V, Viret M, Morales R, Batlle X and Schuller I K 2005 Appl. Phys. Lett. 87 222509 (Pubitemid 41669246)
24. Roy S et al 2005 Phys. Rev. Lett. 95 047201 (Pubitemid 41506237)
25. Li Z-P, Petracic O, Morales R, Olamit J, Batlle X, Liu K and Schuller I K 2006 Phys. Rev. Lett. 96 217205 (Pubitemid 43838409)
26. Fitzsimmons M R, Kirby B J, Roy S, Li Z-P, Roshchin I V, Sinha S K and Schuller I K 2007 Phys. Rev. B 75 214412
27. Morales R, Li Z-P, Olamit J, Liu K, Alameda J M and Schuller I K 2009 Phys. Rev. Lett. 102 097201
28. Li Z-P, Morales R and Schuller I K 2009 Appl. Phys. Lett. 94 142503
29. Kovylina M, Erekhinsky M, Morales R, Villegas J E, Schuller I K, Labarta A and Batlle X 2009 Appl. Phys. Lett. 95 152507
30. Roshchin I V, Petracic O, Morales R, Li Z-P, Batlle X and Schuller I K International Patent PCT/US2005/025129
31. Nogués J, Lederman D, Moran T J and Schuller I K 1996 Phys. Rev. Lett. 76 4624