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Journal of Sol-Gel Science and Technology

Volumn 58, Issue 1, 2011, Pages 24-32

Preparation and characterization of nanocrystalline CoFe2O 4 deposited on SiO2: In situ sol-gel process

(7) Prakash, I a Nallamuthu, N a Muralidharan, P a Venkateswarlu, M b Misra, Manjusri c,d Mohanty, Amar c,d Satyanarayana, N a,d

a PONDICHERRY UNIVERSITY (India)

b Amara Raja Batteries Limited (India)

c UNIVERSITY OF GUELPH (Canada)

d UNIVERSITY OF GUELPH (Canada)

Author keywords

FTIR; HRTEM; In situ sol gel; SAED; SEM EDS; SiO2 CoFe2O4 nanocomposite; TG TDA; XRD

Indexed keywords

FTIR; HRTEM; IN-SITU; SAED; SEM-EDS; SIO2/COFE2O4 NANOCOMPOSITE; TG/TDA; XRD;

CATALYSTS; CRYSTALLITE SIZE; DIFFERENTIAL THERMAL ANALYSIS; DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCOMPOSITES; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SOL-GELS; SOLS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

SOL-GEL PROCESS;

EID: 79954606113 PISSN: 09280707 EISSN: None Source Type: Journal
DOI: 10.1007/s10971-010-2350-2 Document Type: Article

Times cited : (14)

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