Erratum: Characterization and analysis of CaO-SiO2-B 2O3 ternary system ceramics (Journal of Materials Science: Materials in Electronics (DOI: 10.1007/s10854-010-0148-1));Characterization and analysis of CaO-SiO2-B2O 3 ternary system ceramics

Journal of Materials Science: Materials in Electronics

Volumn 22, Issue 4, 2011, Pages 389-393

  Ming, He ^a,b   Ren, Zhang Shu ^a   Hua, Zhou Xiao ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CHENGDU TECHNOLOGICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING STRENGTH; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; SILICA; SILICATE MINERALS; SINTERING; TERNARY SYSTEMS; THERMAL EXPANSION; X RAY DIFFRACTION;

CALCINATION TEMPERATURE; CRYSTALLINE PHASE; LINEAR THERMAL EXPANSION COEFFICIENTS; MECHANICAL AND DIELECTRIC PROPERTIES; QUANTITIVE; SINTERING TEMPERATURES; SOLID-PHASE METHOD; THERMAL AND MECHANICAL PROPERTIES;

LOW-K DIELECTRIC;

EID: 79954601978     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-010-0205-9     Document Type: Erratum

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