IVAT and aVAT: Enhanced visual analysis for cluster tendency assessment

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6118 LNAI, Issue PART 1, 2010, Pages 16-27

  Wang, Liang ^a   Nguyen, Uyen T V ^b   Bezdek, James C ^b   Leckie, Christopher A ^b   Ramamohanarao, Kotagiri ^b  

^a University of Bath   (United Kingdom)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Chamfer matching; Cluster tendency assessment; Path based distance; VAT; Visual cluster analysis

Indexed keywords

CHAMFER MATCHING; CLUSTER TENDENCY; PATH-BASED DISTANCE; VAT; VISUAL CLUSTER ANALYSIS;

CLUSTER ANALYSIS; DATA MINING; VIRTUAL REALITY;

RATING;

EID: 79954573338     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-13657-3_5     Document Type: Conference Paper

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