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Volumn 47, Issue 3, 2011, Pages 40-45
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CCDs lose ground to new CMOS sensors
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS CHIPS;
CMOS DEVICES;
CMOS IMAGERS;
CMOS SENSORS;
FAST SIGNAL;
FILL FACTOR;
LENSLET ARRAY;
LIGHT CONCENTRATION;
MEMS TECHNOLOGY;
NATURAL VARIATION;
PERFORMANCE LIMITATIONS;
PROCESSING CAPABILITY;
READ NOISE;
SCIENTIFIC APPLICATIONS;
SENSOR OUTPUT;
CMOS INTEGRATED CIRCUITS;
FIRMWARE;
LOGIC GATES;
PIXELS;
QUANTUM EFFICIENCY;
SEMICONDUCTOR DEVICES;
SENSORS;
SIGNAL PROCESSING;
FIELD PROGRAMMABLE GATE ARRAYS (FPGA);
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EID: 79954572569
PISSN: 10438092
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (4)
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References (0)
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