|
Volumn 636, Issue 1 SUPPL., 2011, Pages
|
Development of large-area silicon photomultiplier detectors for PET applications at FBK
|
Author keywords
Positron emission tomography; Silicon photomultiplier; SiPM array
|
Indexed keywords
ACCELERATED STRESS;
AUTOMATIC TEST;
BASIC PARAMETERS;
CURRENT VOLTAGE CURVE;
ELECTRICAL CHARACTERIZATION;
FUNCTIONING DEVICES;
MONOLITHIC ARRAYS;
REVERSE BIAS;
SILICON PHOTOMULTIPLIER;
SIPM ARRAY;
UNIFORM DISTRIBUTION;
WAFER LEVEL;
PARAMETER ESTIMATION;
PHOTOMULTIPLIERS;
POSITRONS;
SILICON DETECTORS;
SILICON WAFERS;
TESTING;
POSITRON EMISSION TOMOGRAPHY;
|
EID: 79954415369
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.04.111 Document Type: Conference Paper |
Times cited : (36)
|
References (18)
|