On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: Successes and limitations

Semiconductor Science and Technology

Volumn 26, Issue 6, 2011, Pages

  Sellier, H ^a   Hackens, B ^b   Pala, M G ^c   Martins, F ^b   Baltazar, S ^c   Wallart, X ^d   Desplanque, L ^d   Bayot, V ^a,b   Huant, S ^a  

^a CNRS   (France)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c IMEP LAHC   (France)

^d INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAP; ELECTRON TRANSPORT; HIGH-FIELD; PRACTICAL ISSUES; QUANTUM HALL REGIME; QUANTUM RING; SEMICONDUCTOR QUANTUM STRUCTURES; TIP-INDUCED;

ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; SCANNING;

QUANTUM CHEMISTRY;

EID: 79953905723     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/26/6/064008     Document Type: Article

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